Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures

Abstract

The free-charge carrier mobility, sheet density, and effective mass of a two-dimensional electron gas are exemplarily determined in the spectral range from 640 GHz to 1 THz in a AlGaN/GaN heterostructure using the optical-Hall effect at room temperature. Complementary midinfrared spectroscopic ellipsometry measurements are performed for analysis of heterostructure constituents layer thickness, phonon mode, and free-charge carrier parameters. The electron effective mass is determined to be (0.22±0.04)m0. The high-frequency sheet density and carrier mobility parameters are in good agreement with results from dc electrical Hall effect measurements, indicative for frequency-independent carrier scattering mechanisms of the two-dimensional carrier distribution.

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 28, 2011
Source ID
10.1063/1.3556617

Entities

People

  • A. Boosalis
  • C. M. Herzinger
  • J. A. Woollam
  • Junxia Shi
  • Lester F. Eastman
  • Mathias Schubert
  • P. Kühne
  • S. Schöche
  • T. Hofmann
  • W. J. Schaff

Organizations

  • Army Research Office
  • Cornell University
  • National Science Foundation
  • University of Nebraska–Lincoln

Tags

Fields of Study

  • Materials science

Readers

  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene