Electric-poling-induced magnetic anisotropy and electric-field-induced magnetization reorientation in magnetoelectric Ni/(011) [Pb(Mg1/3Nb2/3)O3](1-x)-[PbTiO3]x heterostructure
Abstract
This study reports the influence of poling a PMN-PT single crystal laminated structure on the magnetic properties of a 35 nm polycrystalline Ni thin film. During the poling process, a large anisotropic remanent strain is developed in the PMN-PT that is transferred to the ferromagnetic film creating a large predefined magnetic anisotropy. Test results show that operating the PMN-PT substrate in the linear regime following poling produces sufficient anisotropic strain to reversibly reorient the magnetization toward an easy axis oriented 90° to the magnetic easy axis induced during poling. The influence of poling prestress on the magnetic anisotropy field, coercive field and magnetic remanence is discussed.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 01, 2011
- Source ID
- 10.1063/1.3563040
Entities
People
- Alexandre Bur
- Chin-jui Hsu
- Gregory P. Carman
- Hyungsuk K. D. Kim
- Joshua Leon Hockel
- Kang L. Wang
- Kin Wong
- Tao Wu
Organizations
- Air Force Office of Scientific Research
- University of California