Thermal conductivity as a metric for the crystalline quality of SrTiO3 epitaxial layers
Abstract
Measurements of thermal conductivity Λ by time-domain thermoreflectance in the temperature range 100<T<300 K are used to characterize the crystalline quality of epitaxial layers of a prototypical oxide, SrTiO3. Twenty samples from five institutions using two growth techniques, molecular beam epitaxy and pulsed laser deposition (PLD), were analyzed. Optimized growth conditions produce layers with Λ comparable to bulk single crystals. Many PLD layers, particularly those that use ceramics as the target material, show surprisingly low Λ. For homoepitaxial layers, the decrease in Λ created by point defects correlates well with the expansion of the lattice parameter in the direction normal to the surface.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- May 30, 2011
- Source ID
- 10.1063/1.3579993
Entities
People
- Arun Majumdar
- Bharat Jalan
- Charles M. Brooks
- Chen-wei Liang
- Darrell G. Schlom
- David G. Cahill
- Dong-wook Oh
- Jayakanth Ravichandran
- Lane W Martin
- Mark Huijben
- Ramamoorthy Ramesh
- Susanne Stemmer
- Wolter Siemons
Organizations
- ARPA-E
- Air Force Office of Scientific Research
- Cornell University
- United States Department of Energy
- University of California
- University of Illinois Urbana–Champaign
- University of Twente