Room temperature device performance of electrodeposited InSb nanowire field effect transistors

Abstract

InSb nanowires have been formed by electrodeposition in porous anodic alumina templates and employed as transistor channels. The 100 nm diameter nanowires had a zinc blende crystal structure. Single-nanowire field-effect transistors (NW-FETs) with a channel length of 500 nm exhibited on-currents of ∼40 μA, on/off ratios of ∼16–20, drain conductances of ∼71 μS and field-effect electron mobility of ∼1200 cm2 V−1 s−1. Compared with reported NW-FETs, the on-current is large and the current saturation occurs at low source-drain voltages. These characteristics can be understood in terms of velocity saturation effects with enhanced scattering.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 13, 2011
Source ID
10.1063/1.3587638

Entities

People

  • Collin J. Delker
  • David B. Janes
  • Dmitri Zakharov
  • Suprem R. Das
  • Timothy D. Sands
  • Yong P. Chen

Organizations

  • Defense Advanced Research Projects Agency
  • Purdue University

Tags

Fields of Study

  • Materials science

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Semiconductor Device Technology
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics