In-situ stoichiometry determination using x-ray fluorescence generated by reflection-high-energy-electron-diffraction
Abstract
A major challenge in the stoichiometric growth of complex oxide compounds is the control of the relative compositions of the constituent materials. A potential avenue for compositional analysis during growth is the use of x-ray fluorescence generated during reflection high energy electron diffraction measurements. Using this technique, relative compositions of Y and Mn in molecular beam epitaxy grown YMnO3 samples were studied. Comparing the results with Rutherford back scattering spectroscopy suggests that the technique has the potential for real-time analysis of elemental fluxes and stoichiometry control during sample growth.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 01, 2011
- Source ID
- 10.1063/1.3592219
Entities
People
- Cameron Keenan
- David Lederman
- Sandeep Chandril
- T. H. Myers
Organizations
- Office of Naval Research
- Texas State University
- West Virginia University