Kelvin probe microscopy and electronic transport in graphene on SiC(0001) in the minimum conductivity regime
Abstract
Ambient-environment Kelvin probe microscopy of many (10 μm)2 areas of single-layer graphene on SiC(0001) shows area-to-area rms surface potential variation of 12 meV. Electronic transport data are consistent with the minimum conductivity regime. Together the data indicate a highly uniform carrier concentration with a small magnitude (<1012 cm−2). We conclude that the previously reported large spread in carrier densities from Hall measurements on similar samples is an artifact of electron–hole puddling in the minimum conductivity regime.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 13, 2011
- Source ID
- 10.1063/1.3595360
Entities
People
- A. E. Curtin
- C. R. Eddy Jr.
- D. Kurt Gaskill
- J. L. Tedesco
- M. S. Fuhrer
- R. L. Myers-ward
Organizations
- Office of Naval Research
- United States Naval Research Laboratory
- University of Maryland