Structural, dielectric, ferroelectric and piezoresponse force microscopy characterizations of bilayered Bi0.9Dy0.1FeO3/K0.5Na0.5NbO3 lead-free multiferroic films
Abstract
The structure, dielectric and ferroelectric properties of the bilayered Bi0.9Dy0.1FeO3/K0.5Na0.5NbO3 (BDF/KNN) lead-free thin films deposited on the Pt/TiO2/SiO2/Si substrates by pulsed laser deposition with different thickness ratios have been characterized. It is found that the introduction of the bottom KNN layer can effectively reduce the leakage current of the composite film, allowing the high polarization of the BDF layer to be displayed. The bilayered film with KNN to BDF thickness ratio of 1.2 exhibits the best dielectric and ferroelectric properties, with a remanent polarization 2Pr = 16.3 μC/cm2. The polar domain structure of that film has been imaged by means of piezoresponse force microscopy (PFM) and the switching of the polarization has been realized under an applied electric field of ±12 V, confirming the ferroelectricity in the BDF/KNN composite film.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 01, 2012
- Source ID
- 10.1063/1.4746086
Entities
People
- Aifen Tian
- Ling Chen
- Peng Shi
- Wei Ren
- Xiaoqing Wu
- Zuo-Guang Ye
Organizations
- Office of Naval Research
- Simon Fraser University