Growth and ferromagnetic resonance properties of nanometer-thick yttrium iron garnet films
Abstract
Growth of nm-thick yttrium iron garnet films and ferromagnetic resonance (FMR) linewidth properties in the films are reported. The films were grown on gadolinium gallium garnet substrates by pulsed laser deposition (PLD). Films in the 5–35 nm thickness range showed a (111) orientation and a surface roughness between 0.1 and 0.3 nm. The 10 nm films showed a 10 GHz FMR linewidth of about 6 Oe and a damping constant of 3.2 × 10−4. The FMR linewidth increases with both the surface roughness and the surface Fe deficiency. Thicker films exhibit a smaller FMR linewidth and a lower damping constant.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 08, 2012
- Source ID
- 10.1063/1.4759039
Entities
People
- Axel Hoffmann
- Helmut Schultheiss
- Houchen Chang
- Michael Jantz
- Michael Kabatek
- Mingzhong Wu
- William M Schneider
- Yiyan Sun
- Young-yeal Song
Organizations
- Argonne National Laboratory
- Army Research Office
- Colorado State University
- National Institute of Standards and Technology
- National Science Foundation
- United States Department of Energy