Pyroelectric current measurements on PbZr0.2Ti0.8O3 epitaxial layers
Abstract
We report pyroelectric current measurements on 150 nm thick PbZr0.2Ti0.8O3 (PZT) epitaxial films using frequency-domain thermal measurements over the range 0.02 Hz–1.3 MHz. The measured pyroelectric currents are proportional to the rate of temperature change, from ∼10−5 A/m2 to ∼103 A/m2 over the range 10−2 to 106 K/s. The film temperature oscillation is controlled using either a hotplate, microfabricated heater, or modulated laser, and the pyroelectric current is measured from a microelectrode fabricated onto the film. The measured pyroelectric coefficient of the PZT films is nearly constant across the entire frequency range at ≈−200 μC/m2K.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 15, 2012
- Source ID
- 10.1063/1.4766271
Entities
People
- B Bhatia
- David G. Cahill
- J. Karthik
- L. W. Martin
- T. Tong
- William P King
Organizations
- Office of Naval Research
- University of Illinois Urbana–Champaign