Radiation tolerance characterization of dual band InAs/GaSb type-II strain-layer superlattice pBp detectors using 63 MeV protons

Abstract

The radiation tolerance characterization of dual band InAs/GaSb type-II strain-layer superlattice pBp detectors of varying size using 63 MeV proton irradiation is presented. The detectors' mid-wave infrared performance degraded with increasing proton fluence ΦP up to 3.75 × 1012 cm−2 or, equivalently, a total ionizing dose = 500 kRad (Si). At this ΦP, an ∼31% drop in quantum efficiency η, ∼2 order increase in dark current density JD, and consequently, >1 order drop in calculated detectivity D* were observed. Proton damage factors were determined for η and D*. Arrhenius-analysis of temperature-dependent JD measurements reflected significant changes in the activation energies following irradiation.

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 17, 2012
Source ID
10.1063/1.4772543

Entities

People

  • C. P. Morath
  • E. Plis
  • J. E. Hubbs
  • S. Krishna
  • S. Myers
  • V. M. Cowan

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory
  • University of New Mexico

Tags

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Semiconductor Device Technology

Technology Areas

  • Quantum Computing