Near-field infrared absorption of plasmonic semiconductor microparticles studied using atomic force microscope infrared spectroscopy
Abstract
We report measurements of near-field absorption in heavily silicon-doped indium arsenide microparticles using atomic force microscope infrared spectroscopy (AFM-IR). The microparticles exhibit an infrared absorption peak at 5.75 μm, which corresponds to a localized surface plasmon resonance within the microparticles. The near-field absorption measurements agree with far-field measurements of transmission and reflection, and with results of numerical solutions of Maxwell equations. AFM-IR measurements of a single microparticle show the temperature increase expected from Ohmic heating within the particle, highlighting the potential for high resolution infrared imaging of plasmonic and metamaterial structures.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 15, 2013
- Source ID
- 10.1063/1.4802211
Entities
People
- Christopher M. Roberts
- Daniel M. Wasserman
- Jonathan R. Felts
- Stephanie Law
- Viktor Podolskiy
- William P King
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- Office of Science
- University of Illinois Urbana–Champaign
- University of Massachusetts Lowell