Optical thickness determination of hexagonal boron nitride flakes
Abstract
Optical reflectivity contrast provides a simple, fast, and noninvasive method for characterization of few monolayer samples of two-dimensional materials. Here, we apply this technique to measure the thickness of thin flakes of hexagonal Boron Nitride (hBN), which is a material of increasing interest in nanodevice fabrication. The optical contrast shows a strong negative peak at short wavelengths and zero contrast at a thickness dependent wavelength. The optical contrast varies linearly for 1-80 layers of hBN, which permits easy calibration of thickness. We demonstrate the applicability of this quick characterization method by comparing atomic force microscopy and optical contrast results.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 22, 2013
- Source ID
- 10.1063/1.4803041
Entities
People
- Arvinder Sandhu
- Brian J LeRoy
- Dheeraj Golla
- Kanokporn Chattrakun
- Kenji Watanabe
- Takashi Taniguchi
Organizations
- Army Research Office
- National Institute for Materials Science
- University of Arizona