Microstructural variations in Cu/Nb and Al/Nb nanometallic multilayers

Abstract

Miscible (Al/Nb) and immiscible (Cu/Nb) nanometallic multilayer systems were characterized by means of transmission electron microscopy techniques, primarily by automated crystallographic orientation mapping, which allows for the resolution of crystal structures and orientations at the nanoscale. By using this technique, distinctive Nb orientations in relation to the crystallographic state of the Al and Cu layer structures can be observed. Specifically, the Al and Cu layers were found to consist of amorphous, semi-amorphous, and crystalline regions, which affect the overall multilayer microstructure.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 17, 2013
Source ID
10.1063/1.4811822

Entities

People

  • A. M. Hodge
  • C. Kübel
  • Dafu Wang
  • E. Courtois-manara
  • K. Chakravadhanula
  • M. N. Polyakov

Organizations

  • Helmholtz Institute Ulm
  • Karlsruhe Institute of Technology
  • Office of Naval Research
  • University of Southern California

Tags

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene