Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading
Abstract
We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼103–104 s−1 in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 01, 2014
- Source ID
- 10.1063/1.4893881
Entities
People
- A. G. Ananiadis
- A. R. Woll
- C. J. Hustedt
- Daniel Casem
- E. L. Huskins
- H. T. Philipp
- J. Almer
- J. S. Okasinski
- J. T. Weiss
- K. T. Ramesh
- Kenneth Vecchio
- M. W. Tate
- Minghui Zhao
- P. K. Lambert
- P. Kenesei
- Prafull Purohit
- S. M. Gruner
- T. C. Hufnagel
- V. Kannan
Organizations
- Argonne National Laboratory
- Cornell University
- Johns Hopkins University
- Oak Ridge Institute for Science and Education
- Office of Naval Research
- United States Army Research Laboratory
- University of California, San Diego