Retention failure analysis of metal-oxide based resistive memory

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 15, 2014
Source ID
10.1063/1.4896154

Entities

People

  • Jihang Lee
  • Shinhyun Choi
  • Sungho Kim
  • Wei Lu

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation
  • University of Michigan