Quantification of thermal and contact resistances of scanning thermal probes
Abstract
Scanning thermal probes are widely used for imaging temperature fields with nanoscale resolution, for studying near-field radiative heat transport and for locally heating samples. In all these applications, it is critical to know the thermal resistance to heat flow within the probe and the thermal contact resistance between the probe and the sample. Here, we present an approach for quantifying the aforementioned thermal resistances using picowatt resolution heat flow calorimeters. The measured contact resistance is found to be in good agreement with classical predictions for thermal contact resistance. The techniques developed here are critical for quantitatively probing heat flows at the nanoscale.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 17, 2014
- Source ID
- 10.1063/1.4902075
Entities
People
- Dakotah Thompson
- Edgar Meyhofer
- Kyeongtae Kim
- Pramod Reddy
- Seid Sadat
- Wonho Jeong
- Woochul Lee
Organizations
- Army Research Office
- Office of Naval Research
- University of Michigan