The Seebeck coefficient and phonon drag in silicon
Abstract
We present a theory of the phonon-drag Seebeck coefficient in nondegenerate semiconductors, and apply it to silicon for temperatures 30 < T < 300 K. Our calculation uses only parameters from the literature, and previous calculations of the phonon lifetime. We find excellent agreement with the measurements of Geballe and Hull [Phys. Rev. 98, 940 (1955)]. The phonon-drag term dominates at low temperature, and shows an important dependence on the dimensions of the experimental sample.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Dec 28, 2014
- Source ID
- 10.1063/1.4904925
Entities
People
- D. A. Broido
- G. D. Mahan
- Lucas R. Lindsay
Organizations
- Boston College
- Oak Ridge National Laboratory
- Office of Naval Research
- Pennsylvania State University