Large area strain analysis using scanning transmission electron microscopy across multiple images
Abstract
Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 05, 2015
- Source ID
- 10.1063/1.4905368
Entities
People
- A. A. Oni
- Avinash Kumar
- J. M. Lebeau
- Krishna Rajan
- S. Broderick
- S. Dumpala
- S. Sinnott
- S. V. Raju
- Shefali Saxena
- X. Sang
Organizations
- Air Force Office of Scientific Research
- Florida International University
- Iowa State University
- North Carolina State University
- University of Florida