Complex refractive index tunability of graphene at 1550 nm wavelength
Abstract
The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO2/Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 19, 2015
- Source ID
- 10.1063/1.4906349
Entities
People
- Feng Xu
- H-Y Chiu
- H.-c. Chien
- J. Wu
- Qingcao Liu
- R. Hui
- S. Das
- Yan Gong
Organizations
- Anhui University
- Army Research Office
- National Science Foundation
- University of Kansas