High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging
Abstract
We demonstrate a high-throughput charged particle analysis platform, which is based on lensfree on-chip microscopy for rapid ion track analysis using allyl diglycol carbonate, i.e., CR-39 plastic polymer as the sensing medium. By adopting a wide-area opto-electronic image sensor together with a source-shifting based pixel super-resolution technique, a large CR-39 sample volume (i.e., 4 cm × 4 cm × 0.1 cm) can be imaged in less than 1 min using a compact lensfree on-chip microscope, which detects partially coherent in-line holograms of the ion tracks recorded within the CR-39 detector. After the image capture, using highly parallelized reconstruction and ion track analysis algorithms running on graphics processing units, we reconstruct and analyze the entire volume of a CR-39 detector within ∼1.5 min. This significant reduction in the entire imaging and ion track analysis time not only increases our throughput but also allows us to perform time-resolved analysis of the etching process to monitor and optimize the growth of ion tracks during etching. This computational lensfree imaging platform can provide a much higher throughput and more cost-effective alternative to traditional lens-based scanning optical microscopes for ion track analysis using CR-39 and other passive high energy particle detectors.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 13, 2015
- Source ID
- 10.1063/1.4918741
Entities
People
- Alon Greenbaum
- Aydoğan Özcan
- Cagatay Gulec
- Chandrashekhar J. Joshi
- Chao Gong
- Faizan Shabbir
- Jeremy Pigeon
- Jessica Shaw
- Sergei Tochitsky
- Wei Luo
Organizations
- Army Research Office
- Howard Hughes Medical Institute
- National Science Foundation
- Office of Naval Research
- United States Department of Energy
- University of California