Three-dimensional multimodal imaging and analysis of biphasic microstructure in a Ti–Ni–Sn thermoelectric material
Abstract
The three-dimensional microstructure of levitation melted TiNi1.20Sn has been characterized using the TriBeam system, a scanning electron microscope equipped with a femtosecond laser for rapid serial sectioning, to map the character of interfaces. By incorporating both chemical data (energy dispersive x-ray spectroscopy) and crystallographic data (electron backscatter diffraction), the grain structure and phase morphology were analyzed in a 155 μm × 178 μm × 210 μm volume and were seen to be decoupled. The predominant phases present in the material, half-Heusler TiNiSn, and full-Heusler TiNi2Sn have a percolated structure. The distribution of coherent interfaces and high-angle interfaces has been measured quantitatively.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 01, 2015
- Source ID
- 10.1063/1.4931764
Entities
People
- Jason E. Douglas
- McLean P. Echlin
- Ram Seshadri
- Tresa M. Pollock
- William C. Lenthe
Organizations
- Air Force Research Laboratory
- National Science Foundation
- University of California