Exchange bias and bistable magneto-resistance states in amorphous TbFeCo thin films

Abstract

Amorphous TbFeCo thin films sputter deposited at room temperature on thermally oxidized Si substrate are found to exhibit strong perpendicular magnetic anisotropy. Atom probe tomography, scanning transmission electron microscopy, and energy dispersive X-ray spectroscopy mapping have revealed two nanoscale amorphous phases with different Tb atomic percentages distributed within the amorphous film. Exchange bias accompanied by bistable magneto-resistance states has been uncovered near room temperature by magnetization and magneto-transport measurements. The exchange anisotropy originates from the exchange interaction between the ferrimagnetic and ferromagnetic components corresponding to the two amorphous phases. This study provides a platform for exchange bias and magneto-resistance switching using single-layer amorphous ferrimagnetic thin films that require no epitaxial growth.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 04, 2016
Source ID
10.1063/1.4939240

Entities

People

  • Arun Devaraj
  • Chung T. Ma
  • Jiwei Lu
  • Ryan Comes
  • S. J. Poon
  • Steven R Spurgeon
  • Xiaopu Li

Organizations

  • Defense Threat Reduction Agency
  • Environmental Molecular Sciences Laboratory
  • Pacific Northwest National Laboratory
  • United States Department of Energy
  • University of Virginia

Tags

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene