Electro-mechanical response of top-gated LaAlO3/SrTiO3

Abstract

LaAlO3/SrTiO3 heterostructures are known to exhibit a sharp, hysteretic metal-insulator transition (MIT) with large enhanced capacitance near depletion. To understand the physical origin of this behavior, the electromechanical response of top-gated LaAlO3/SrTiO3 heterostructures is probed using two simultaneous measurement techniques: piezoresponse force microscopy (PFM) and capacitance spectroscopy. The observed hysteretic PFM responses show strong correlation with the capacitance signals, suggesting an interfacial carrier-mediated structural distortion associated with the gate-tuned MIT. In addition, the frequency dependence of the capacitance enhancement in LaAlO3/SrTiO3 is found to be well-matched to local PFM measurements. Our experimental results provide a fuller understanding of the top-gate tuned MIT in oxide heterostructure, which could be helpful for the development of future oxide-based nanoelectronics.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 14, 2016
Source ID
10.1063/1.4940045

Entities

People

  • Chang-Beom Eom
  • Chung-wung Bark
  • Feng Bi
  • Jeremy Levy
  • Mengchen Huang
  • Patrick Irvin
  • Sanghan Lee
  • Sangwoo Ryu

Organizations

  • Air Force Office of Scientific Research
  • Division of Materials Research
  • Pittsburgh Quantum Institute
  • University of Pittsburgh
  • University of Wisconsin–Madison

Tags

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems