Factors affecting the f × Q product of 3C-SiC microstrings: What is the upper limit for sensitivity?

Abstract

The fn × Q (Hz) is a crucial sensitivity parameter for micro-electro-mechanical sensing. We have recently shown a fn × Q product of ∼1012 Hz for microstrings made of cubic silicon carbide on silicon, establishing a new state-of-the-art and opening new frontiers for mass sensing applications. In this work, we analyse the main parameters influencing the frequency and quality factor of silicon carbide microstrings (material properties, microstring geometry, clamping condition, and environmental pressure) and investigate the potential for approaching the theoretical upper limit. We indicate that our previous result is only about a factor 2 lower than the thermoelastic dissipation limit. For fully reaching this upper limit, a substantial reduction of the defects in the silicon carbide thin film would be required, while maintaining a high residual tensile stress in the perfect-clamped strings.

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 02, 2016
Source ID
10.1063/1.4941274

Entities

People

  • Atieh Ranjbar Kermany
  • Francesca Iacopi
  • George A. Brawley
  • James S. Bennett
  • Warwick P. Bowen

Organizations

  • Air Force Office of Scientific Research
  • Australian Research Council
  • Griffith University
  • University of Queensland

Tags

Readers

  • Economics
  • Structural Dynamics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems