E/N effects on K values revealed by high precision measurements under low field conditions
Abstract
Ion mobility spectrometry (IMS) is used to detect chemical warfare agents, explosives, and narcotics. While IMS has a low rate of false positives, their occurrence causes the loss of time and money as the alarm is verified. Because numerous variables affect the reduced mobility (K0) of an ion, wide detection windows are required in order to ensure a low false negative response rate. Wide detection windows, however, reduce response selectivity, and interferents with similar K0 values may be mistaken for targeted compounds and trigger a false positive alarm. Detection windows could be narrowed if reference K0 values were accurately known for specific instrumental conditions. Unfortunately, there is a lack of confidence in the literature values due to discrepancies in the reported K0 values and their lack of reported error. This creates the need for the accurate control and measurement of each variable affecting ion mobility, as well as for a central accurate IMS database for reference and calibration. A new ion mobility spectrometer has been built that reduces the error of measurements affecting K0 by an order of magnitude less than ±0.2%. Precise measurements of ±0.002 cm2 V−1 s−1 or better have been produced and, as a result, an unexpected relationship between K0 and the electric field to number density ratio (E/N) has been discovered in which the K0 values of ions decreased as a function of E/N along a second degree polynomial trend line towards an apparent asymptote at approximately 4 Td.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 01, 2016
- Source ID
- 10.1063/1.4955208
Entities
People
- Brian C Hauck
- Charles S. Harden
- Herbert H. Hill
- Vincent M. Mchugh
- William F. Siems
Organizations
- Army Research Office
- Edgewood Chemical Biological Center
- Washington State University