Native point defect formation in flash sintered ZnO studied by depth-resolved cathodoluminescence spectroscopy
Abstract
Depth-resolved cathodoluminescence spectroscopy studies of flash sintered ZnO reveal that thermal runaway induces the formation of native point defects inside individual grains. Defects associated with oxygen vacancies (VO) form preferentially, contributing additional donors that increase conductivity within the grains of the polycrystalline material. Hyperspectral imaging of the granular cross sections shows filaments of increased VO following thermal runaway between the capacitor anode and cathode, supporting a heating mechanism localized on a granular scale. Within the grains, these defects form preferentially inside rather than at their boundaries, further localizing the dominant heating mechanism.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 08, 2016
- Source ID
- 10.1063/1.4962316
Entities
People
- Hantian Gao
- Jian Luo
- Jon W. Cox
- Leonard J Brillson
- Thaddeus J. Asel
- Yuanyao Zhang
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- Ohio State University
- University of California