Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor

Abstract

An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors.

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2016
Source ID
10.1063/1.4962428

Entities

People

  • Christian W. Smith
  • E. M. Smith
  • Farnood Khalilzadeh-rezaie
  • Justin W. Cleary
  • Masa Ishigami
  • Nima Nader
  • Robert E. Peale
  • Shiva Vangala

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory
  • National Science Foundation
  • University of Central Florida
  • Wyle Laboratories

Tags

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Optical Physics and Photonics.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene