An optically pumped 2.5 μm GeSn laser on Si operating at 110 K

Abstract

This paper reports the demonstration of optically pumped GeSn edge-emitting lasers grown on Si substrates. The whole device structures were grown by an industry standard chemical vapor deposition reactor using the low cost commercially available precursors SnCl4 and GeH4 in a single run epitaxy process. Temperature-dependent characteristics of laser-output versus pumping-laser-input showed lasing operation up to 110 K. The 10 K lasing threshold and wavelength were measured as 68 kW/cm2 and 2476 nm, respectively. Lasing characteristic temperature (T0) was extracted as 65 K.

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 24, 2016
Source ID
10.1063/1.4966141

Entities

People

  • Aboozar Mosleh
  • Baohua Li
  • Bria Collier
  • Greg Sun
  • Hameed A. Naseem
  • Jifeng Liu
  • Joe Margetis
  • John Tolle
  • Mansour Mortazavi
  • Randy Quinde
  • Richard Soref
  • Sattar Al-Kabi
  • Seyed Amir Ghetmiri
  • Shui-Qing Yu
  • Thach Pham
  • Wei Dou
  • Wei Du
  • Yiyin Zhou

Organizations

  • Air Force Office of Scientific Research
  • Dartmouth College
  • National Science Foundation
  • University of Arkansas
  • University of Arkansas at Pine Bluff
  • University of Massachusetts Boston
  • University of Minnesota

Tags

Fields of Study

  • Engineering
  • Physics

Readers

  • Materials Science and Engineering.
  • Pulsed Power and Plasma Physics.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers