Tunneling magnetoresistance sensors with different coupled free layers
Abstract
Large differences of magnetic coercivity (HC), exchange coupling field (HE), and tunneling magnetoresistance ratio (TMR) in magnetic tunnel junctions with different coupled free layers are discussed. We demonstrate that the magnetization behavior of the free layer is not only dominated by the interfacial barrier layer but also affected largely by the magnetic or non-magnetic coupled free layers. All these parameters are sensitively controlled by the magnetic nanostructure, which can be tuned also by the magnetic annealing process. The optimized sensors exhibit a large field sensitivity of up to 261%/mT in the region of the reversal synthetic ferrimagnet at the pinned layers.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 01, 2017
- Source ID
- 10.1063/1.4977774
Entities
People
- Dan Ewing
- Paul J. De Rego
- Sy-hwang Liou
- Xiaolu Yin
- Yen-Fu Liu
- Yi Yang
Organizations
- Division of Electrical, Communications & Cyber Systems
- United States Department of Defense
- United States Department of Energy
- University of Nebraska–Lincoln