Characterization of an active metasurface using terahertz ellipsometry
Abstract
Switchable metasurfaces fabricated on a doped epi-layer have become an important platform for developing techniques to control terahertz (THz) radiation, as a DC bias can modulate the transmission characteristics of the metasurface. To model and understand this performance in new device configurations accurately, a quantitative understanding of the bias-dependent surface characteristics is required. We perform THz variable angle spectroscopic ellipsometry on a switchable metasurface as a function of DC bias. By comparing these data with numerical simulations, we extract a model for the response of the metasurface at any bias value. Using this model, we predict a giant bias-induced phase modulation in a guided wave configuration. These predictions are in qualitative agreement with our measurements, offering a route to efficient modulation of THz signals.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Nov 06, 2017
- Source ID
- 10.1063/1.5004194
Entities
People
- Alexander Benz
- Antoinette J. Taylor
- Daniel Mittleman
- Henry O. Everitt
- Hou-Tong Chen
- Igal Brener
- John L. Reno
- Martin S. Heimbeck
- Nicholas Karl
- Rajind Mendis
Organizations
- Army Research Office
- Aviation and Missile Research, Development, and Engineering Center
- Brown University
- Los Alamos National Laboratory
- National Science Foundation
- Sandia National Laboratories