Effect of mechanical and electrical stimuli in conductive atomic force microscopy with noble metal-coated tips
Abstract
Conductive atomic force microscopy has been widely employed to study the localized electrical properties of a wide range of substrates in non-vacuum conditions by the use of noble metal-coated tips. However, quantitative characterization of the electrical properties was often precluded by unpredictable changes in the tip apex morphology, and/or electronic transport characteristics of undesired oxide overcoats on the tip. In this paper, the impact of mechanical and electrical stimuli on the apex geometry of gold coated tips and electrical conduction properties at the tip-substrate contact is discussed by choosing gold and highly ordered pyrolytic graphite as the representative tip and substrate materials, respectively.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 03, 2018
- Source ID
- 10.1063/1.5006080
Entities
People
- Hung-sen Kang
- Min Hwan Lee
- Vishal Zade
Organizations
- Air Force Office of Scientific Research
- United States Department of Energy
- University of California