MgB2 Josephson junctions produced by focused helium ion beam irradiation

Abstract

Planar magnesium diboride Josephson junctions are fabricated using focused helium ion beam irradiation. A single track of ion irradiation with a 30 kV He+ beam with nominal beam diameter < 0.5 nm is used to create a normal-metal barrier on a MgB2 film deposited by hybrid physical-chemical vapor deposition. Josephson coupling is observed below the critical temperature of the electrodes for a He+ doses between 8x1015/cm2 to 4x1016/cm2. Analysis of the temperature dependence of the normal resistance and critical voltage of the junctions shows highly uniform barriers with nearly ideal resistively-shunted junction behavior for higher-dose junctions, while nonequilibrium effects dominate the properties of lower-dose junctions over most of the temperature range. These results demonstrate that focused helium ion beam irradiation can produce high-quality proximity-coupled MgB2 Josephson junctions with tailorable properties, promising for use in superconducting devices and circuits.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2018
Source ID
10.1063/1.5030751

Entities

People

  • Bruce Davidson
  • Ke Chen
  • L. C. Feldman
  • Leila Kasaei
  • T. Gustafsson
  • Thomas Melbourne
  • V. Manichev
  • X. X. Xi

Organizations

  • National Science Foundation
  • Office of Naval Research
  • Rutgers University
  • Temple University

Tags

Fields of Study

  • Physics

Readers

  • Pulsed Power and Plasma Physics.
  • Semiconductor Device Technology