Electron emission from carbon velvet due to incident xenon ions
Abstract
We present measurements of the ion-induced electron emission from carbon velvet. The results from carbon velvet with high aspect ratio vertical fibers (6.8 μm diameter and 2.6 mm length) show a more than 60% reduction in ion-induced electron emission for normal incident xenon ions over the entire ion incident energy investigated (i.e., 500–2000 eV) when compared to graphite. This is important for plasma-facing surfaces that are exposed to large fluxes of energetic ions, such as beam dumps and chamber walls used to control facility effects in plasma-thruster ground tests.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 23, 2018
- Source ID
- 10.1063/1.5037200
Entities
People
- M. I. Patino
- Richard E. Wirz
Organizations
- Air Force Office of Scientific Research
- California Space Grant Consortium
- University of California
- University of California, Los Angeles