Effect of buffer iron doping on delta-doped β-Ga2O3 metal semiconductor field effect transistors
Abstract
We report on the effect of iron (Fe)-doped semi-insulating buffers on the electron transport and DC-RF dispersion in Si delta (δ)-doped β-Ga2O3 metal-semiconductor field effect transistors. The effect of the distance between the 2-dimensional electron gas and the Fe-doped region was investigated, and Fe doping in the buffer was found to have a significant effect on the transport properties. It was found that buffers thicker than 600 nm can enable better transport and dispersion properties for field effect transistors, while maintaining relatively low parasitic buffer leakage. This work can provide guidance for the use of Fe-doped insulating buffers for future Ga2O3 based electronics.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 17, 2018
- Source ID
- 10.1063/1.5039502
Entities
People
- Aaron R. Arehart
- Chandan Joishi
- Joe F. McGlone
- Saurabh Lodha
- Siddharth Rajan
- Steven A. Ringel
- Yuewei Zhang
- Zhanbo Xia
Organizations
- Defense Threat Reduction Agency
- Office of Naval Research
- Ohio State University