Direct observation of electrons in microwave vacuum components

Abstract

Apparatus which is used to directly observe electrons in microwave vacuum components was designed and implemented into a WR-284 like waveguide operated at 2.85 GHz with up to approx. 1 MW power. To generate desired electric field levels for driving secondary emission, the waveguide structure is manipulated by reducing the test section height to 6 mm from the standard WR-284 rectangular waveguide height of 34 mm. Both test and standard sections were operated in the dominant TE10 mode. A 1 mm aperture was cut into the broadside wall of the waveguide section enabling a portion of electrons in the waveguide to enter a properly biased electron multiplier tube mounted atop of the test section. Waveforms are presented showing the direct measurement of electrons, providing a local detection method with nanosecond temporal resolution. Future work will incorporate the test setup for multipactor studies.

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2019
Source ID
10.1063/1.5089764

Entities

People

  • Alvin V. Garcia
  • Andreas Neuber
  • J. Dickens
  • John Mankowski
  • M. Powell
  • Z Shaw

Organizations

  • Air Force Office of Scientific Research
  • Texas Tech University

Tags

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Microwave Engineering.
  • Solar Physics

Technology Areas

  • Microelectronics