Metal oxide catalyzed epitaxy (MOCATAXY) of β-Ga2O3 films in various orientations grown by plasma-assisted molecular beam epitaxy

Abstract

In this work, the growth of (010), (001), and 2¯01 β-Ga2O3 by plasma assisted molecular beam epitaxy was investigated. The presence of an indium flux during growth markedly expands the growth regime for β-Ga2O3 across all orientations to higher growth temperatures and growth rates. This metal oxide catalyzed growth allows for similar growth rates of around 5 nm/min across all three orientations, more than twice that of conventional (010) growth and seven times that of (001) growth without indium. Smooth surface morphologies for (010) and (001) β-Ga2O3 were demonstrated, while 2¯01 was significantly rougher. Additionally, doping with Sn was achieved across all orientations and Hall measurements demonstrated higher electron mobility (55 cm2/Vs for a carrier concentration of 3.3 × 1018 cm−3) for (001) β-Ga2O3 grown via metal oxide catalyzed epitaxy than conventional growth.

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2020
Source ID
10.1063/1.5135930

Entities

People

  • Akhil Mauze
  • Feng Wu
  • James S. Speck
  • Takeki Itoh
  • Yuewei Zhang

Organizations

  • Air Force Office of Scientific Research
  • Defense Threat Reduction Agency
  • Office of Naval Research
  • University of California

Tags

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene