Toward a quantitative analysis of the temperature dependence of electron attachment to SF6
Abstract
New flowing afterglow/Langmuir probe investigations of electronic attachment to SF6 are described. Thermal attachment rate constants are found to increase from 1.5 × 10−7 cm3 s−1 at 200 K to 2.3 × 10−7 cm3 s−1 at 300 K. Attachment rate constants over the range of 200–700 K (from the present work and the literature), together with earlier measurements of attachment cross sections, are analyzed with respect to electronic and nuclear contributions. The latter suggest that only a small nuclear barrier (of the order of 20 meV) on the way from SF6 to SF6− has to be overcome. The analysis shows that not only s-waves but also higher partial waves have to be taken into account. Likewise, finite-size effects of the neutral target contribute in a non-negligible manner.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 26, 2020
- Source ID
- 10.1063/5.0002705
Entities
People
- Albert A Viggiano
- John C Poutsma
- Juergen Troe
- Nicholas S Shuman
- Thomas M Miller
Organizations
- Air Force Office of Scientific Research
- Air Force Research Laboratory
- Boston College
- College of William & Mary
- University of Göttingen