Superconducting microwire detectors based on WSi with single-photon sensitivity in the near-infrared
Abstract
We report on the fabrication and characterization of single-photon-sensitive WSi superconducting detectors with wire widths from 1 μm to 3 μm. The devices achieve the saturated internal detection efficiency at a wavelength of 1.55 μm and exhibit maximum count rates in excess of 105 s−1. We also investigate the material properties of the silicon-rich WSi films used for these devices. We find that many devices with active lengths of several hundred micrometers exhibit critical currents in excess of 50% of the depairing current. A meandered detector with a 2.0 μm wire width is demonstrated over a surface area of 362 × 362 μm2, showcasing the material and device quality achieved.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jun 15, 2020
- Source ID
- 10.1063/5.0006221
Entities
People
- A. Lita
- B. Korzh
- Jason Allmaras
- Jeff Chiles
- Jeffrey Shainline
- M. D. Shaw
- Richard P Mirin
- S. W. Nam
- Sonia Buckley
- V. B. Verma
Organizations
- Defense Advanced Research Projects Agency
- Jet Propulsion Laboratory
- National Aeronautics and Space Administration
- National Institute of Standards and Technology