Observation of carrier concentration dependent spintronic terahertz emission from n-GaN/NiFe heterostructures

Abstract

The development of terahertz (THz) spintronics has created a paradigm shift in the generation of THz radiation through the combination of ultrafast magnetism and spin-based electronics. However, research in this area has primarily focused on all-metallic devices comprising a ferromagnetic thin film adjacent to a non-magnetic heavy metal. Here, we report the experimental observation of spintronic THz emission from an n-doped wide bandgap semiconductor, n-GaN. We found that the amplitude of THz emission strongly depends on the carrier concentration of the semiconductor layer, which could be attributed to the tunable Rashba state occurring at the n-GaN/ferromagnet interface. Our work offers exciting prospects for pursuing wide bandgap semiconductor-based spintronic THz devices and demonstrating their intriguing spin Hall physics at the ultrafast timescale.

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 31, 2020
Source ID
10.1063/5.0011009

Entities

People

  • Dali Sun
  • Dovletgeldi Seyitliyev
  • Eric Vetter
  • Kenan Gundogdu
  • Melike Biliroglu
  • Pramod Reddy
  • Ramón Collazo
  • Ronny Kirste
  • Zlatko Sitar

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation
  • North Carolina State University

Tags

Fields of Study

  • Materials science
  • Physics

Readers

  • Optical Physics and Photonics.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics