Secondary electron emission from reticulated cellular copper surfaces
Abstract
An experimental and computational study of the secondary electron yield (SEY) of copper foam is presented. Ray-tracing Monte Carlo (MC) simulations, based on primary electron transport and interactions with the electron system in solid and foam-type copper, are also included. The 3D reticulated foam geometry is explicitly represented in the MC model. This allows the influence of the complex copper surface on the energy and angular dependence of the SEY to be determined. Experimental measurements of SEY were performed in a high-vacuum electron gun chamber. Solid copper and copper foam with 100 pores per inch and a 4.6% volume fraction were tested for energy and angular dependence of SEY. Incident angles were varied from 0° to 75° and electron beam energy ranged from 20 eV to 570 eV. The agreement between MC simulations and experiments suggests that a general reduction of the SEY by around 20% is due to the interaction and subsequent adsorption of a fraction of emitted secondary electrons on the internal surfaces of the reticulated foam. Moreover, it is found that the SEY becomes nearly independent of the incident electron energy above 200 eV for steep angles of incidence (θ>45°).
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 28, 2020
- Source ID
- 10.1063/5.0015528
Entities
People
- Aimee Hubble
- Dylan Dickstein
- Hsing-Yin Chang
- Jaime Marian
- Matthew Feldman
- Nasr M. Ghoniem
- Rostislav Spektor
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- The Aerospace Corporation
- University of California