Enhancing hyperspectral EELS analysis of complex plasmonic nanostructures with pan-sharpening

Abstract

Nanoscale hyperspectral techniques—such as electron energy loss spectroscopy (EELS)—are critical to understand the optical response in plasmonic nanostructures, but as systems become increasingly complex, the required sampling density and acquisition times become prohibitive for instrumental and specimen stability. As a result, there has been a recent push for new experimental methodologies that can provide comprehensive information about a complex system, while significantly reducing the duration of the experiment. Here, we present a pan-sharpening approach to hyperspectral EELS analysis, where we acquire two datasets from the same region (one with high spatial resolution and one with high spectral fidelity) and combine them to achieve a single dataset with the beneficial properties of both. This work outlines a straightforward, reproducible pathway to reduced experiment times and higher signal-to-noise ratios, while retaining the relevant physical parameters of the plasmonic response, and is generally applicable to a wide range of spectroscopy modalities.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 04, 2021
Source ID
10.1063/5.0031324

Entities

People

  • Delia Milliron
  • Jordan A Hachtel
  • Nikolay Borodinov
  • Olga S Ovchinnikova
  • Progna Banerjee
  • Rama K. Vasudevan
  • Shin Hum Cho

Organizations

  • Army Research Office
  • National Science Foundation
  • Oak Ridge National Laboratory
  • Robert A. Welch Foundation
  • Samsung Electronics
  • United States Department of Energy
  • University of Texas at Austin

Tags

Fields of Study

  • Physics

Readers

  • Computer Vision.
  • Nanoscale Plasmonic Nanotechnology
  • Systems Analysis and Design

Technology Areas

  • Microelectronics