Homoepitaxial β-Ga2O3 transparent conducting oxide with conductivity σ = 2323 S cm−1

Abstract

Conductive homoepitaxial Si-doped β-Ga2O3 films were fabricated by pulsed laser deposition with an as-deposited 2323 S cm−1 conductivity (resistivity = 4.3 × 10−4 Ω-cm, carrier concentration = 2.24 × 1020 cm−3, mobility = 64.5 cm2 V−1 s−1, and electrical activation efficiency = 77%). High quality homoepitaxial films deposited on commercial (010) Fe-compensated β-Ga2O substrates were determined by high-resolution transmission electron microscopy and x-ray diffraction. The β-Ga2O3 films have ∼70% transparency from 3.7 eV (335 nm) to 0.56 eV (2214 nm). The combination of high conductivity and transparency offers promise for numerous ultrawide bandgap electronics and optoelectronic applications.

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2021
Source ID
10.1063/5.0062056

Entities

People

  • Andrew J. Green
  • Celesta S. Chang
  • D. C. Look
  • David A. Muller
  • Hyung Min Jeon
  • Jeff L. Brown
  • Kelson D. Chabak
  • Kevin Leedy
  • Vladimir Vasilyev
  • Ştefan C. Bǎdescu

Organizations

  • Air Force Research Laboratory
  • Cornell University
  • KBR, Inc.
  • Massachusetts Institute of Technology
  • National Science Foundation
  • Wright State University

Tags

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene