Elucidating proximity magnetism through polarized neutron reflectometry and machine learning

Abstract

Polarized neutron reflectometry is a powerful technique to interrogate the structures of multilayered magnetic materials with depth sensitivity and nanometer resolution. However, reflectometry profiles often inhabit a complicated objective function landscape using traditional fitting methods, posing a significant challenge for parameter retrieval. In this work, we develop a data-driven framework to recover the sample parameters from polarized neutron reflectometry data with minimal user intervention. We train a variational autoencoder to map reflectometry profiles with moderate experimental noise to an interpretable, low-dimensional space from which sample parameters can be extracted with high resolution. We apply our method to recover the scattering length density profiles of the topological insulator–ferromagnetic insulator heterostructure Bi2Se3/EuS exhibiting proximity magnetism in good agreement with the results of conventional fitting. We further analyze a more challenging reflectometry profile of the topological insulator–antiferromagnet heterostructure (Bi,Sb)2Te3/Cr2O3 and identify possible interfacial proximity magnetism in this material. We anticipate that the framework developed here can be applied to resolve hidden interfacial phenomena in a broad range of layered systems.

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 01, 2022
Source ID
10.1063/5.0078814

Entities

People

  • Alexander J. Grutter
  • Cui-Zu Chang
  • Henry Heiberger
  • Leon Fan
  • Lingjie Zhou
  • Mingda Li
  • Nina Andrejevic
  • Thanh Nguyen
  • Yi-Fan Zhao
  • Zhantao Chen

Organizations

  • Massachusetts Institute of Technology
  • National Institute of Standards and Technology
  • National Science Foundation
  • Pennsylvania State University
  • United States Department of Energy

Tags

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • AI & ML
  • AI & ML - Bayesian Inference
  • AI & ML - Information Retrieval
  • AI & ML - Machine Learning Algorithms
  • AI & ML - Neural Networks
  • Microelectronics
  • Microelectronics - Graphene
  • Space