A simple approach for characterizing the spatially varying sensitivity of microchannel plate detectors

Abstract

We present a simple approach to characterize the spatial variation of the gain in microchannel plate (MCP) coupled to phosphor detectors using single electron or photon hits. The technique is easy to implement and general enough to be extended to other kinds of detectors. We demonstrate the efficacy of the approach on both laboratory and Monte Carlo generated datasets. Furthermore, we use the approach to measure the variation in gain over time as the MCP is exposed to an increasing number of electrons.

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2022
Source ID
10.1063/5.0092346

Entities

People

  • Andrei Nomerotski
  • Brian Kaufman
  • Carlos Trallero
  • Chuan Cheng
  • Denis Aglagul
  • Thomas Weinacht
  • Tobias Saule

Organizations

  • Air Force Office of Scientific Research
  • Brookhaven National Laboratory
  • National Science Foundation
  • Stony Brook University
  • United States Department of Energy
  • University of Connecticut

Tags

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Nuclear and Radiation Engineering.
  • Regression Analysis.

Technology Areas

  • Microelectronics