AlN/AlGaN/AlN quantum well channel HEMTs
Abstract
We present a compositional dependence study of electrical characteristics of AlxGa1−xN quantum well channel-based AlN/AlGaN/AlN high electron mobility transistors (HEMTs) with x=0.25,0.44, and 0.58. This ultra-wide bandgap heterostructure is a candidate for next-generation radio frequency and power electronics. The use of selectively regrown n-type GaN Ohmic contacts results in contact resistance that increases as the Al content of the channel increases. The DC HEMT device characteristics reveal that the maximum drain current densities progressively reduce from 280 to 30 to 1.7 mA/mm for x=0.25,0.44, and 0.58, respectively. This is accompanied by a simultaneous decrease (in magnitude) in threshold voltage from −5.2 to −4.9 to −2.4 V for the three HEMTs. This systematic experimental study of the effects of Al composition x on the transistor characteristics provides valuable insights for engineering AlGaN channel HEMTs on AlN for extreme electronics at high voltages and high temperatures.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- May 29, 2023
- Source ID
- 10.1063/5.0145582
Entities
People
- Austin Hickman
- Debdeep Jena
- Eungkyun Kim
- Huili Grace Xing
- Jashan Singhal
- Reet Chaudhuri
- Yong-Jin Cho
Organizations
- Air Force Office of Scientific Research
- Cornell University
- National Science Foundation