Photon gating in four-dimensional ultrafast electron microscopy
Abstract
In this contribution, we demonstrate a unique concept in the use of photon-induced near-field electron microscopy—combining one electron pulse and two optical pulses—as a probe for ultrafast dynamics of matter in electron microscopy. Photon–electron coupling permits the use of a short optical pulse to gate the electron pulse, which is serving as a probe of the ultrafast dynamics triggered by another optical pulse. This technique provides the high spatial and temporal resolution of the electron pulse and optical laser pulses, respectively, both in ultrafast electron microscopy (UEM) measurements. This development paves the way for numerous studies in imaging of matter not only with few femtosecond resolution but also with the potential for attosecond imaging in UEM.
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Oct 05, 2015
- Source ID
- 10.1073/pnas.1517942112
Entities
People
- Ahmed Zewail
- Haihua Liu
- John Spencer Baskin
- Mohammed T Hassan
Organizations
- Air Force Office of Scientific Research
- California Institute of Technology
- National Science Foundation