Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 15, 2018
Source ID
10.1080/15567265.2018.1503382

Entities

People

  • Feng He
  • Jihoon Jeong
  • Ke Chen
  • Nathanial Sheehan
  • Seth R. Bank
  • Xianghai Meng
  • Yaguo Wang
  • Yongjian Zhou

Organizations

  • Division of Chemical, Bioengineering, Environmental, and Transport Systems
  • Division of Engineering Education & Centers
  • Small Business Innovation Research and Small Business Technology Transfer
  • United States Army Research Laboratory
  • University of Texas at Austin

Tags

Technology Areas

  • Microelectronics