Measuring the signature of bias and temperature-dependent barrier heights in III-N materials using a hot electron transistor
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Aug 11, 2015
- Source ID
- 10.1088/0268-1242/30/10/105003
Entities
People
- Donald J. Suntrup Iii
- Geetak Gupta
- Haoran Li
- S. Keller
- Umesh Mishra
Organizations
- Office of Naval Research