The effect of annealing temperature on the stability of gallium tin zinc oxide thin film transistors
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Aug 11, 2015
- Source ID
- 10.1088/0268-1242/30/10/105004
Entities
People
- Briana Mccall
- Ngoc Cuong Nguyen
- Robert Alston
- Shanthi Iyer
- Ward Collis
Organizations
- Army Research Office