ALD gate dielectrics for improved threshold voltage stability in AlGaN/GaN MOS-HFETs for power applications

Document Details

Document Type
Pub Defense Publication
Publication Date
Nov 20, 2015
Source ID
10.1088/0268-1242/30/12/125017

Entities

People

  • Bongmook Lee
  • Narayanan Ramanan
  • Veena Misra

Organizations

  • National Science Foundation
  • Office of Naval Research